Electrostatic discharge mainly harms electronic devices through discharge radiation, electrostatic induction, electromagnetic induction, and conduction coupling. Electrostatic discharge belongs to pulse type interference, and its interference with electronic circuits generally depends on the amplitude, width, and energy of the pulse. Although the charged voltage or energy during some electrostatic discharges is not significant, their instantaneous energy density can also cause interference and harm to the period and circuit due to their short duration of operation.

Static electricity can damage electronic components

In the research and production process of modern electronics industry, the application of large-scale integrated circuits is becoming increasingly widespread. Large scale integrated circuits have the characteristics of small size and fast speed, precisely due to the short spacing and small area between their internal circuits. However, this inevitably comes at the expense of their withstand voltage and current parameters. CMOS circuits are the most common type of circuit in integrated circuits, which are extremely sensitive to static electricity. Especially in circuits designed with increasingly low operating voltages, due to the extremely thin gate oxide film of the device, the voltage withstand limit is very low, and small charges can cause device damage. Electrostatic discharge can immediately charge the inter electrode capacitance of the device to a high voltage, causing the oxide to be damaged, resulting in short circuits, open circuits, breakdown, and melting of the metallized layer.

The damage caused by electrostatic discharge is often only 10%, resulting in complete failure of electronic components at that time

In the electrostatic damage of electronic components, only 10% of the damage caused by electrostatic discharge often results in complete failure of electronic components at that time, usually manifested as short circuits, open circuits, and severe changes in parameters, exceeding their rated range, and the device completely loses its specific function; And the other 90% will lurk down, causing cumulative effects. In general, a single ESD (electrostatic discharge) is not enough to cause immediate complete failure of the device, but there will be some degree of slight damage inside the component, usually manifested as small parameter deviation or drift, and the potential failure is not obvious because it is easily overlooked. If this type of component continues to work with damage, the cumulative effect will become more and more obvious with the increase of ESD times, The degree of damage will gradually intensify, ultimately leading to failure.